Electrical Overstress (EOS) and Electrostatic Discharge (ESD) have become more of a threat to microelectronic circuits due to increased component density making them more vulnerable to transient electrical phenomena. This handbook addresses some of the important issues involved and describes sound engineering practices for minimizing the threat. This publication was authored by visiting Clarkson University Professor Henry Domingos while on sabbatical at the RIAC (then the RAC). Dr. Domingos is a well-known authority on EOS/ESD and a leader of the EOS/ESD Symposium.
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