Physics-of-Failure Based Handbook of Microelectronic Systems

This new publication presents a unique approach for microelectronic system reliability assessment and qualification based on physics of failure. The Handbook illustrates a very straightforward and common sense approach to reliability assessment that includes the well known property of constant rate failures that industry observes in the field with the mostly academic approach of physics-of-failures evaluation. Simply stated, the authors have developed a system by which a reliability engineer can take data from accelerated life testing that tests only a single mechanism, by design, and relate it to the proportion of constant rate failures that are observed in the field. Then, the results of both field data and test data can be used in order to more properly model the expected lifetime behavior of electronics as they operate under specified conditions. The work covers over seven years of research at the University of Maryland, College Park (in collaboration with Tel Aviv University and Bar Ilan University in Israel) that has been funded through the AVSI Aerospace Consortium run out of Texas A&M University, the Office of Naval Research, the US Department of Defense (DoD) and the Reliability Information Analysis Center (RIAC).

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