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A reliability model for SAC solder covering isothermal mechanical cycling and thermal cycling condit WARP-ADMIN	11-13-2012 11:25 AM by WARP-ADMIN	0	4,674
A physical based model to predict performance degradation of FinFET WARP-ADMIN	11-13-2012 09:18 AM by WARP-ADMIN	0	943
A compact model for early electromigration failures of copper dual-damascene interconnects WARP-ADMIN	10-16-2012 10:13 AM by WARP-ADMIN	0	1,083
A Microstructural Model for Predicting High Cycle Fatigue Life of Steels WARP-ADMIN	10-01-2012 11:34 AM by WARP-ADMIN	0	699
On Low Cycle Fatigue Life of Nickel-Based Superalloy Valve Membranes Under Non-proportional Loading WARP-ADMIN	10-01-2012 10:09 AM by WARP-ADMIN	0	454
Improved Modeling of the Effect of R-Ratio on Crack Growth Rate WARP-ADMIN	10-01-2012 09:10 AM by WARP-ADMIN	0	385
Fatigue Life Prediction under Conditions where Cyclic Creep Fatigue Interaction Occurs WARP-ADMIN	09-17-2012 11:19 AM by WARP-ADMIN	0	730
Effect of Axial Ratcheting Deformation on Torsional Low Cycle Fatigue Life of Lead-Free Solder Sn-Ag WARP-ADMIN	09-17-2012 10:42 AM by WARP-ADMIN	0	428
Fatigue-Creep Behavior of 1.25Cr0.5Mo Steel at High Temperature and its Life Prediction WARP-ADMIN	09-17-2012 09:54 AM by WARP-ADMIN	0	420
A New Low Cycle Fatigue Criterion for Isothermal and Out-of-Phase Thermomechanical Loading WARP-ADMIN	09-17-2012 08:46 AM by WARP-ADMIN	0	441
Analysis of the Effects of Compressive Stresses on Fatigue Crack Propagation Rate WARP-ADMIN	09-11-2012 01:34 PM by WARP-ADMIN	0	534
Deep-Trap SILC (Stress Induced Leakage Current) Model For Nominal and Weak Oxides WARP-ADMIN	09-07-2012 02:28 PM by WARP-ADMIN	0	515
Fatigue Life of 63Sn-37Pb Solder Related to Load Drop Under Uniaxial and Torsional Loading WARP-ADMIN	09-07-2012 11:18 AM by WARP-ADMIN	0	442
Chip Scale Package (CSP) Solder Joint Reliability and Modeling WARP-ADMIN	03-23-2012 04:27 PM by WARP-ADMIN	0	2,021
Threshold Voltage Shift in 0.1 ?m Self-Aligned-Gate GaAs MESFETs Under Bias Stress WARP-ADMIN	03-22-2012 04:12 PM by WARP-ADMIN	0	1,104
Charge Trapping Mechanism under Dynamic Stress and its Effect on Failure Time WARP-ADMIN	03-22-2012 10:50 AM by WARP-ADMIN	0	929
Polarity-Dependent Device Degradation in SONOS Transistors Due to Gate Conduction WARP-ADMIN	01-16-2012 04:40 PM by WARP-ADMIN	0	1,924
Scintillation Breakdowns and Reliability of Solid Tantalum Capacitors WARP-ADMIN	01-16-2012 02:21 PM by WARP-ADMIN	0	969
Thin-Gate-Oxide Breakdown and CPU Failure-Rate Estimation WARP-ADMIN	01-16-2012 10:40 AM by WARP-ADMIN	0	905
Re-consideration of Influence of Silicon Wafer Surface Orientation on Gate Oxide Reliability WARP-ADMIN	01-13-2012 03:29 PM by WARP-ADMIN	0	1,066

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