This is just an Excerpt from a larger document, click here to view the entire document.About the Author
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Norman B. Fuqua is a Senior Engineer with Alion Science and Technology. He has 44 years of varied experience in the field of dependability, reliability, and maintainability and has applied these principles to a variety of military, space, and commercial programs. At Alion Science and Technology, and its predecessor IIT Research Institute (IITRI), he has been responsible for reliability and maintainability training and for the planning and implementation of various dependability, reliability, and maintainability study programs.
Mr. Fuqua developed unique distance learning Web-based and Windows-based computer-aided reliability training courses. He is the developer and lead instructor for the Reliability Analysis Center's (RIAC) popular Electronic Design Reliability Training Course. This three-day course has been presented over 200 times to some 7,000 students in the US, England, Denmark, Norway, Sweden, Finland, Germany, Israel, Canada, Australia, Brazil, and India. Audiences have included space, military, industrial, and commercial clients.
He was also the lead developer and instructor for a two-day Dependability Training Course for an Automotive Supplier and a three-day Robust Circuit Design Training Course. These courses enable mechanical and electronic design engineers and reliability engineers to utilize advanced software-based tools in producing designs that exhibit minimum sensitivity to both internal and external variations.
Mr. Fuqua holds a Bachelor of Science degree in Electrical Engineering from the University of Illinois, Urbana Illinois, is a Registered Professional Engineer (Quality Engineer) in California (retired), and a Senior Member of the IEEE and the IEEE Group on Reliability.
He is a former Member of the Editorial Board, "Electrical and Electronics Series," for Marcel Dekker Inc., and the Education and Training Editor for the "SAE Communications in Reliability, Maintainability and Supportability Journal." He is also a former Member of the EOS/ESD Association, and Chairman of three different EOS/ESD Association Standards Committees. He is the author of a number of technical papers, twenty RIAC publications and a reliability college textbook published by Marcel Dekker Inc.
