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About the Author

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John P. Farrell is a senior engineer for IIT Research Institute and serves as an advisor to the Reliability Analysis Center. Before joining IITRI, he was active in developing microelectronic reliability assurance procedures at the Air Force Rome Laboratory, formerly known as the Rome Air Development Center. At IITRI he has been active in technology transfer activities in both military and commercial microelectronics applications. Mr. Farrell holds a bachelor's degree in Physics from Syracuse University. He holds the Defense Standardization Award for QML, VHSIC Pioneer Award, ISHM's Technical Achievement Award and the Outstanding Civilian Career Performance and Meritorious Civilian Service awards.