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INSIDE
T h e J o u r n a l o f t h e
4
Statistical Analysis of
Reliability Data, Part
2: On Estimation and
Testing
9
Industry News
10
Product Liability in
the New Acquisition
Environment: A Topic
Requiring a Partnered
Solution from the
Military and Its
Contractors
21
Future Events
22
From the Editor
Reliability Analysis Center
Third Quarter - 2001
Introduction
The author of this paper has given seminars to
the FAA and commercial airlines on the subjects
of Probability, Reliability, and Markov Analysis.
This experience revealed some misunderstand-
ings among the engineering community con-
cerning Fault Tree Analysis (FTA) and Markov
Analysis (MA). The confusion is not due to the
communitys lack of talent or interest, but pri-
marily to a lack of good publications on these
subjects written in a clear common language.
FTA and MA are two major methods used for
calculating the probability of failure (Pf) of elec-
trical and electronic systems. In an attempt to
eliminate some of the confusion, this paper com-
pares the two methods and discusses why and
when one should be used and not the other.
Calculating Probability of Failure
Four basic tasks for calculating system Pf are:
1. Clearly identify the undesired event.
2. Perform a qualitative analysis by con-
structing a model of the sequence of
events leading to the undesired event.
This model accurately describes the logic
flow of the entire process leading to the
event. Does the undesired event involve a
component failure? Do two or more com-
ponents need to fail in some sequence?
Do certain components need to fail during
a certain phase of the mission? In short, a
qualitative model describes in detail the
logic flow of the entire process leading to
an undesired event.
3. Perform a Reliability Prediction for the
component piece parts.
4. Perform a quantitative analysis by con-
structing a mathematical model (a set of
equations based on the logic derived
from the qualitative model), and calculat-
ing the probability of the undesired event
over a specified time interval.
FTA Limitations
Traditionally, tasks 2 and 4 have been performed
using FTA, the most commonly known and uti-
lized method. However, what is not commonly
known is that FTA has two major limitations.
(Note: In order to understand one of these limi-
tations, the engineer must understand the con-
cept of combinatorial vs. non-combinatorial
problems. One of the objectives of this paper is
to enhance the readers understanding of this
concept with the help of example problems.)
The two major FTA limitations are:
1. With respect to electrical or electronic
systems FTAs do an excellent job with
tasks 2 and 4 with combinatorial prob-
lems.
However, FTAs have difficulty
with both when dealing with non-combi-
natorial problems.
2. With respect to systems utilizing mechan-
ical devices, while FTAs can be used
effectively for task 2, they have much dif-
ficulty with task 4. Calculating Pf of sys-
tems with mechanical devices requires
other methodologies. It is a subject unto
itself and is not addressed in this paper.
Pertinent Excerpts
The following excerpts pertain to calculating Pf
of electrical and electronic systems.
Excerpt from FAAs ARP4761 Issue 1996-12:
a. It is difficult if not impossible to allow
for various types of failure modes and
Calculating Probability of Failure of Electronic and
Electrical Systems (Markov vs. FTA)
By: Vito Faraci Jr., Lockheed Martin Fairchild Systems
T h e J o u r n a l o f t h e R e l i a b i l i t y A n a l y s i s C e n t e r
T h i r d Q u a r t e r - 2 0 0 1
2
dependencies such as transient and intermittent faults and
standby systems with spares.
b. A fault tree is constructed to assess cause and probability
of a single top event. In some situations it may be diffi-
cult for a fault tree to represent a system completely, e.g.,
repairable systems and systems where failure/repair rates
are state dependent. Markov Analyses (MA) do not pos-
sess the indicated limitations. The sequence dependent
events are included and handled naturally, and therefore
cover a wider range of system behaviors.
The complexity and size of systems are rapidly increasing with
new advances in technology.
Aircraft systems are relying more and more on fault tolerant sys-
tems. Such systems hardly ever fail completely because of con-
tinuous monitoring of their condition and instantaneous recon-
figuration of the systems. Given this scenario of fault tolerance,
the safety assessment process and evaluation of such a system
may be more appropriately achieved by the application of the
Markov technique.
Excerpt from NASA Reference Publication
1348
Traditionally, the reliability analysis of a complex system has
been accomplished with combinatorial mathematics. The stan-
dard fault-tree method of reliability analysis is based on such
mathematics. Unfortunately, the fault-tree approach is some-
what limited and incapable of analyzing systems in which recon-
figuration is possible. Basically, a fault tree can be used to
model a system with:
a. Only permanent faults (no transient or intermittent faults)
b. No reconfiguration
c. No time or sequence failure dependencies
d. No state-dependent behavior (e.g., state-dependent fail-
ure rates)
Because fault trees are easier to solve than Markov models, fault
trees should be used wherever these fundamental assumptions
are not violated.
Summary of Excerpts (Why Markov?)
Basically what the preceding excerpts are saying is that the FTA
approach has difficulty handling problems that involve:
a. Transient or intermittent faults,
b. Reconfiguration,
c. Time or sequence failure dependencies,
d. State-dependent behavior (e.g., state-dependent failure
rates).
From a mathematical point of view, a system employing any one
of the above items a. through d. is considered a non-combinato-
rial type system. In other words, what the excerpts are claiming
is that the FTA approach has difficulty handling non-combinato-
rial type problems, and suggests the use of Markov when ana-
lyzing these types.
Note: A pure combinatorial system (or circuit) is a system whose
outputs are functions of its inputs only, with none of the charac-
teristics a. through d.
Introduction to Markov Analysis
If a system or component can be in one of two states (i.e., failed,
non-failed), and if we can define the probabilities associated
with these states on a discrete or continuous basis, the probabil-
ity of being in one or the other at a future time can be evaluated
using a state-time analysis. In reliability and availability analy-
sis, failure probability and the probability of being returned to an
available state are the variables of interest. The best known
state-space technique is Markov Analysis. The Markov method
can be applied under the following constraints:
a. The probabilities of changing from one state to another
must remain constant. Thus the method can only be used
when a constant failure rate is assumed.
b. Future states of the system are independent of all past
states except the immediately preceding one. This is an
important constraint in the analysis of repairable systems,
since it implies that repair returns the system to an as
new condition.
Typical Markov Model
In the typical Markov model (see Figure 1):
The model represents various system states
The transition rate is a function of failure or repair rate
The states are mutually exclusive
The sum of the probabilities must equal 1
Figure 1. Example Markov State Diagram
Markov vs. FTA
Markov and FTA differ in obvious ways. For example, Markov
calculates probabilities of states, while FTA calculates probabil-
PST
State
(2)
PFU
State
(1)
PLOTC
State
(5)
PLT
State
(3)
PDLT
State
(4)
ULOTC-FU
UDLT-Repair
ULT-Repair
LLT
2LST
2LLT
UST-Repair
LST-LOTC-AVE
LLT-LOTC-AVE
100x10-6
LST
T h e J o u r n a l o f t h e R e l i a b i l i t y A n a l y s i s C e n t e r
T h i r d Q u a r t e r - 2 0 0 1
3
ities of top level events. A less obvious difference is the ability
to solve non-combinatorial type problems. Foregoing a rigorous
mathematical discussion, it is sufficient to say that Markov can
yield precise quantitative solutions to non-combinatorial prob-
lems, whereas FTA must resort to various approximation tech-
niques. Both methods can be used for combinatorial problems
and yield identical solutions. The examples that follow serve to
illustrate the solution of combinatorial and non-combinatorial
problems. They each involve calculating the Pf of electrical
devices, and therefore assume constant failure rates. Markov
solutions to these problems were derived using techniques for
solving simultaneous differential equations.
Example 1: Two Components in Series
(Combinatorial)
Two black boxes, A and B, with failure rates a and b, respective-
ly, start operating at the same time. System operation requires
both boxes be functional. Find Pf = Probability of System
Failure.
Note: Full Up State = all devices operating, (n) = State Number,
P(n) = Probability of State (n).
Markov Model
Pf = P(2) = 1 e
(a + b) t
FTA Approach
x = 1 e
at
y = 1 e
bt
Pf = x + y xy = 1 e
(a + b) t
Note the solutions (Pf) are identical in both methods.
Example 2: Three Components in Series
(Combinatorial)
Three black boxes, A, B, and C, start operating at the same time.
The failure rates are a, b, and c respectively. Successful system
operation requires all boxes be functional. Find Pf .
Markov Model
Pf = P(2) = 1 e
(a + b + c) t
FTA Approach
x = 1 e
at
y = 1 e
bt
z = 1 e
ct
Pf = x + y + z xy xz yz + xyz = 1 e
(a + b + c) t
Note again the identical solutions.
Example 3: Two Components in Parallel
(Combinatorial)
Two black boxes start operating at the same time. They have
failure rates a and b, respectively. Successful system operation
requires that either Box A or Box B be functional. Find Pf .
Markov Model
Pf = P(4) = (1 e
at
)(1 e
bt
)
FTA Approach
x = 1 e
at
y = 1 e
bt
Pf = xy = (1 e
at
)(1 e
bt
)
Note again the identical solutions.
(1)
(2)
a + b
Full Up
System Fail
(Box A or B Failed)
2B
N O
(1)
(2)
a + b + c
Full Up
System Fail
Pf
x y z
(1)
(4)
Full Up
System Fail
(Box A and B Failed)
(2)
(3)
a
b
a
b
A Failed
B Failed
Pf
x
y
T h e J o u r n a l o f t h e R e l i a b i l i t y A n a l y s i s C e n t e r
T h i r d Q u a r t e r - 2 0 0 1
4
Example 4: Two Components in Parallel with
Required Order Factor (ROF) (Non-combinato-
rial)
Two black boxes start operating at the same time. BoxAhas fail-
ure rate a and Box B has failure rate b.
a. What is the probability that both Boxes fail and that A
fails before B.
b. What is the probability that both Boxes fail and that B
fails before A.
Markov Model
a. P(4) = a/(a + b) + [b/(a + b)] e
(a + b) t
e
bt
b. P(5) = b/(a + b) + [a/(a + b)] e
(a + b) t
e
at
FTA Approach
x = 1 e
at
y = 1 e
bt
a. Pf = ˝xy = ˝ (1 e
at
)(1 e
bt
)
b. Pf = ˝xy = ˝ (1 e
at
)(1 e
bt
)
This ROF problem has a sequence failure dependency, and con-
sequently a non-combinatorial type problem. As can be seen, the
above results are not the same. FTA has difficulty handling such
problems.
Summary
Fault Tree Analysis is a very effective tool used for qualitative
and quantitative analyses of combinatorial type problems. It
uses approximation techniques when solving non-combinatorial
types, and therefore should be used with caution and with full
understanding of this limitation.
Markov Analysis is a very effective tool used for qualitative and
quantitative analyses of combinatorial and non-combinatorial type
problems. However, Markov Analysis Computer Programs tend
to have a limitation on the number of states they can handle.
Remember that, with respect to quantitative analyses, both FTA
and MA methods must be limited to constant failure rate items
and therefore are not applicable to items characterized by a haz-
ard function, e.g., mechanical components that wear out over
time (increasing failure rate).
About the Author
Vito Faraci is a mathematician by education, and an electrical
engineer by trade. He has 12 years of experience with qualita-
tive and quantitative analyses of Reliability, Built-In-Test, and
safety-related events. He has also served as a Reliability and
Markov Analysis consultant for the Federal Aviation
Administration and commercial airlines. Mr. Faraci is also an
adjunct math professor at New York Institute of Technology.
FU
(4)
A
fail
B
fail
a
b
a
b
A,B
fail
B,A
fail
(2)
(1)
(5)(3)
Pf
x
y
1/2
Statistical Analysis of Reliability Data, Part 2: On Estimation and
Testing
By: Jorge Luis Romeu, IIT Research Institute
Introduction
In the first article of this series, random variables (RV), distribu-
tions, and parameters were discussed, and an overview of the
problems of data and outliers was presented. In this article, the
problems associated with sampling, estimation and testing are
discussed. We have seen that every random process (or RV) has
two or more outputs that follow a distinctive pattern (its distri-
bution). And we have seen how such a distribution can be
uniquely specified by a set of fixed values or parameters. Once
these two elements are known, we can answer all pertinent ques-
tions regarding the random process and thus take the necessary
actions to control, forecast or affect its course.
Unfortunately, in almost every practical case, the underlying dis-
tribution and its associated parameters are unknown. In such
cases, the best that we can do is to observe the process (i.e., sam-
ple) and then use these sample observations to:
Reconstruct both the distribution and the parameters that
generated them (estimation) or, alternatively,
Confirm or reject some educated guesses previously
formed about these distribution and parameters (hypoth-
esis testing).
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