Table 23. References for Ensuring Reliable Performance
References Blueprint Sections
3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 3.9 3.10 3.11 3.12 3.13 3.14 3.15
"Bayesian Reliability Tests Made Practical",
Rome Laboratory, RADC-TR-81-106.
        X X
"Environmental Characterization Device
Sourcebook", RAC Publication ECDS.
  X          
"Environmental Stress Screening for
Assemblies", Institute of Environmental
Sciences, 1990.
          X  
"Environmental Stress Screening Guidelines",
July 1993, Tri-Service Technical Brief
002-93-08.
          X  
"Environmental Stress Screening Process
Improvement Study", 1994, Rome
Laboratory Technical Report RL-TR-94-
233.
          X  
"Failure Mode/Mechanism Distributions",
RAC publication FMD.
    X      
"Failure Modes, Effects and Criticality
Analysis", RAC publication FMECA
    X      
"Fundamental Concepts in the Design of
Experiments", Hicks, C.R., Holt, Reinhart
and Winston, 1982.
    X        
"GaAs Microcircuit Characterization &
Failure Analysis Techniques: A
Procedural Guide", RAC publication
MFAT-2.
      X      
"Introduction to Quality Engineering",
Taguchi, G., American Supplier Institute,
1986.
    X        
MIL-HDBK-781, "Reliability Test Methods,
Plans, and Environments for Engineering
Development, Qualification and
Production".
X   X       X X
MIL-STD-810, "Environmental Test Methods
and Engineering Guidelines".
X X X       X  
"Parts Management Plan", RAC START, 95-
2.
      X    
"Quality by Experimental Design", Barker,
T.B., Marcel Dekker, 1985.
    X        
"Reliability Toolkit: Commercial Practices
Edition", Rome Laboratory/Reliability
Analysis Center, Rome, NY, 1995.
X X X X X X X   X X X X X
"Statistical Quality Control", Grant &
Leavenworth McGraw-Hill, 1989.
            X
"Statistics for Experiments", Box, Hunter and
Hunter, John Wiley & Sons, 1978.
    X            
"TQM Toolkit", A. Coppola, RAC
publication, 1993.
    X         X
"Understanding Industrial Designed
Experiments", Schmidt and Launsby, Air
Academy Press, 1989.
    X        
"Vibration Analysis for Electronic
Equipment", Dales, Steinberg, John Wile
& Sons, 1988.
X   X