| References | Blueprint Sections | |||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 3.1 | 3.2 | 3.3 | 3.4 | 3.5 | 3.6 | 3.7 | 3.8 | 3.9 | 3.10 | 3.11 | 3.12 | 3.13 | 3.14 | 3.15 | ||
| "Bayesian Reliability Tests Made Practical", Rome Laboratory, RADC-TR-81-106. |
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| "Environmental Characterization Device Sourcebook", RAC Publication ECDS. |
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| "Environmental Stress Screening for Assemblies", Institute of Environmental Sciences, 1990. |
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| "Environmental Stress Screening Guidelines", July 1993, Tri-Service Technical Brief 002-93-08. |
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| "Environmental Stress Screening Process Improvement Study", 1994, Rome Laboratory Technical Report RL-TR-94- 233. |
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| "Failure Mode/Mechanism Distributions", RAC publication FMD. |
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| "Failure Modes, Effects and Criticality Analysis", RAC publication FMECA |
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| "Fundamental Concepts in the Design of Experiments", Hicks, C.R., Holt, Reinhart and Winston, 1982. |
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| "GaAs Microcircuit Characterization & Failure Analysis Techniques: A Procedural Guide", RAC publication MFAT-2. |
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| "Introduction to Quality Engineering", Taguchi, G., American Supplier Institute, 1986. |
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| MIL-HDBK-781, "Reliability Test Methods, Plans, and Environments for Engineering Development, Qualification and Production". |
X | X | X | X | ||||||||||||
| MIL-STD-810, "Environmental Test Methods and Engineering Guidelines". |
X | X | X | X | ||||||||||||
| "Parts Management Plan", RAC START, 95- 2. |
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| "Quality by Experimental Design", Barker, T.B., Marcel Dekker, 1985. |
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| "Reliability Toolkit: Commercial Practices Edition", Rome Laboratory/Reliability Analysis Center, Rome, NY, 1995. |
X | X | X | X | X | X | X | X | X | X | X | X | ||||
| "Statistical Quality Control", Grant & Leavenworth McGraw-Hill, 1989. |
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| "Statistics for Experiments", Box, Hunter and Hunter, John Wiley & Sons, 1978. |
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| "TQM Toolkit", A. Coppola, RAC publication, 1993. |
X | X | ||||||||||||||
| "Understanding Industrial Designed Experiments", Schmidt and Launsby, Air Academy Press, 1989. |
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| "Vibration Analysis for Electronic Equipment", Dales, Steinberg, John Wile & Sons, 1988. |
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