Table 49. References for Designing for Reliability

References

Sections

3.1

3.2

3.3

3.4

3.5

3.6

3.7

3.8

3.9

3.10

3.11

3.12

3.13

3.14

3.15

3.16

3.17

3.18

3.19

3.20

3.21

3.22

3.23

3.24

3.25

Arsenault, J.E. and Roberts, J.A., "Reliability of Electronic Systems", Computer Science Press, Inc., 1980.

X

X

X

X

X

X

X

Balakrishnan, N., "Life-Testing and Reliability," CRC Press, Boca Raton, FL, 1995.

X

Barker, T.B., "Quality By Experimental Design", Marcel Dekker, Inc., New York, NY, 1985.

X

"Benchmarking Commercial Reliability Practices" by the Reliability Analysis Center, Rome, NY, 1995.

X

Blanton, P., Edwards, D., Schroen, W., "Finite Element Analysis Application to Semiconductor Devices", Ninth Annual IEEE/AESS Avionics Integrity Program Symposium, 1988.

X

Box, G.E.P., Hunter, W.G., Hunter, J.S., "Statistical for Experiments", John Wiley & Sons, NY, NY, 1978.

X

Burkhard, A. H., "Accelerated Testing - A New Vision,", Proceedings 1992 Institute of Environmental Sciences, 1992.

X

Confer, R., J. Canner, T. Trostle, and S. Kurtz, "Use of Highly Accelerated Life Test (HALT) to Determine Reliability of Multilayer Ceramic Capacitors", IEEE Transactions on Reliability, 1991.

X

X

CRTA-WCCA, "Worst Case Circuit Analysis Application Guidelines", Reliability Analysis Center, Rome, NY, 1993.

X

Davis, O.L., "The Design and Analysis of Industrial Experiments", Hafner Publishing Co.

X

Derringer, G., "Considerations in Single and Multiple Stress Accelerated Life Testing," Journal of Quality Technology, Vol. 14, No. 3, July 1982.

X

X

Design Reliability Training Course Manual, Reliability Analysis Center, Rome, NY, 1995.

X

X

X

X

X

X

X

X

X

X

X

Dick, P., "System Effectiveness ... A Key to Assurance", Proceedings Reliability and Maintainability Symposium, 1988.

X

"Engineering Design Handbook, Design for Reliability", US Army Material Command, Alexandria, VA, 1976.

X

"Environmental Characterization Device Sourcebook", Reliability Analysis Center, Rome, NY, 1995.

X

Fisher, R.A., Yates, F., "Statistical Tables for Biological, Agricultural and Medical Research", (4th edition), Edinburgh and London: Oliver & Bayd Ltd., 1953.

X

FMD-91, "Failure Mode/Mechanism Distribution", Reliability Analysis Center, Rome, NY, 1991.

X

X

FMEA, "Failure Mode, Effects and Criticality Analysis", Reliability Analysis Center, Rome, NY, 1993.

X

Followell, D., Fields, S., Liguore, S., "Improvements in Avionic - Durability Analysis", Reliability and Maintainability Symposium, 1993.

X

X

FTA, "Fault Tree Analysis Application Guide", Reliability Analysis Center, Rome, NY, 1990.

X

Fuqua, N.B., "Reliability Engineering for Electronic Design", Marcel Dekker, Inc., New York, NY, 1987.

X

X

X

X

X

X

X

X

X

X

X

Hahn, G. J., and W. Q. Meeker, Jr., "How to Plan an Accelerated Life Test - Some Practical Guidelines," American Society for Quality Control, Statistical Division, Milwaukee, WI, 1985.

X

X

Hicks, C.R., "Fundamental Concepts the Design of Experiments", Holt, Rinehart and Winston, Inc., New York, NY, 1982.

X

Ireson, W.G., Coombs, C.F., "Handbook of Reliability Engineering and Management", McGraw-Hill, New York, NY 1988.

X

X

Kececioglu, D., "Reliability & Life Testing Handbook," PTR Prentice Hall, Englewood Cliffs, NJ, 1994.

X

X

Klinger, D.J., Nakada, Y., Menendz, M.A., "AT&T Reliability Manual" Van Nostrand Reinhold, 1990.

X

X

Klion, J., "Practical Electronic Reliability Engineering", Van Norstrand Reinhold, 1992.

X

X

X

X

X

X

X

Kolarik, W., Rasty, J., Chen, M., Km, Y., "Electronics/Avionics Integrity: Definition, Measurement and Improvement", Reliability and Maintainability Symposium, 1992.

X

X

X

Kreith, F., "Principles of Heat Transfer", 3rd Edition, In Text Education Publishers, NY, NY, 1973.

X

Lambert, R., "Mechanical Durability Prediction Methods", Reliability and Maintainability Symposium, 1989.

X

Mechanical Reliability Training Manual, Reliability Analysis Center, Rome, NY, 1995.

X

X

X

X

MFAT-1, "Microelectronic Failure Analysis Techniques: A Procedural Guide", Reliability Analysis Center, Rome, NY, 1978.

X

MIL-HDBK-217, "Reliability Prediction of Electronic Equipment", 1995.

X

MIL-HDBK-251, "Reliability/ Design Thermal Applications", 1978.

X

MIL-HDBK-338, "Military Handbook, Electronic Design Handbook", 1988 (draft).

X

MIL-HDBK-338B, "Electronic Reliability Design Handbook", Rome Laboratory, Rome, NY, 1988 (draft).

X

X

X

X

X

X

X

X

X

X

X

X

X

X

X

X

MIL-STD-975K, Notice 2, "NASA Standard Parts Derating", 1993

X

Nelson, W., "Accelerated Test; Statistical Models, Test Plans, and Data Analysis," John Wiley & Sons, New York, NY, 1990.

X

NONOP-1, "Nonoperating Reliability Databook", Reliability Analysis Center, Rome, NY, 1987.

X

X

NPRD-95, "Nonelectronic Part Reliability Data", Reliability Analysis Center, Rome, NY, 1995.

X

X

"Parts Selection Application and Control", Reliability Analysis Center, Rome, NY, 1993.

X

X

X

Pecht, M., "Integrated Circuit, Hybrid and Multichip Module Package Design Guideline", John Wiley and Sons, New York, NY, 1994.

X

X

X

"RAC Thermal Management Guidebook", Reliability Analysis Center, Rome, NY, 1995.

X

RADC-TR-82-177, "Reliability Part Derating Guidelines", Rome Laboratory, 1982.

X

RADC-TR-82-179, "Sneak Analysis Application Guidelines", Rome Laboratory, Rome, NY, 1982.

X

RADC-TR-84-254, "Reliability Derating Procedures", Rome Laboratory, 1984.

X

RADC-TR-88-11D, "Reliability/ Maintainability/Testability Design for Dormancy", Rome Laboratory, Rome, NY, 1988.

X

RADC-TR-89-276, "Dormant Missile Test Effectiveness", Rome Laboratory, Rome, NY, 1989.

X

RADC-TR-89-281 "Reliability Assessment Using Finite Element Techniques", Rome Laboratory, Rome, NY, 1989.

X

RADC-TR-90-109, "Integration of Sneak Circuit With Design", Rome Laboratory, Rome, NY, 1990.

X

Raheja, D.G., "Assurance Technologies Principles and Practices", McGraw- Hill Inc., New York, NY, 1991.

X

X

X

X

X

X

X

X

X

"Reliability Toolkit: Commercial Practices Edition", Rome Laboratory/ Reliability Analysis Center, Rome, NY, 1995.

X

X

X

X

X

X

X

X

X

X

X

X

X

X

RL-TR-90-72, "Reliability Analysis Assessment of Advanced Technologies", Rome Laboratory, Rome, NY, 1990.

X

X

RL-TR-91-155, "Computer Aided Assessment of Reliability Using Finite Element Methods", Rome Laboratory, Rome, NY, 1991.

X

RL-TR-91-251, "Reliability Assessment of Wafer Scale Integration Using Finite Element Analysis", Rome Laboratory, Rome, NY, 1991.

X

X

RL-TR-93-209, "A Quality Process Approach to Electronic System Reliability", 1993.

X

X

RL-TR-93-249, "Accelerated Reliability Testing Utilizing Design Experiments," Rome Laboratory, 1993.

X

X

SCAT, "Automated Circuit Analysis Technique", Rome Laboratory, Rome, NY, 1990.

X

Schmidt, S.R., Launsby, R.G., "Understanding Industrial Designed Experiments", Air Force Academy Press Colorado Springs Co., 1989.

X

Shooman, M.L., "Probabilistic Reliability Engineering Approach", McGraw-Hill, 1968.

X

X

X

Stasa, F.L. "Applied Finite Element Analysis for Engineers, Holt Rinehart and Winston, New York, NY, 1985.

X

X

Steinberg, D.S., "Cooling Techniques for Electronic Equipment", John Wiley and Sons, New York, NY, 1980.

X

Taguchi, G., "Introduction to Quality Engineering", American Supplier Institute, Inc., Dearborn, MI, 1986.

X

TE000-AB-GTP-010, "Part Derating Requirement and Application Manual", Naval Sea Command, 1991

X

Tyler, D., "Reliability-Critical Items", NAC R&M-STD-R00208, Indianapolis, IN, 1986.

X

Tyler, D., Gendron R., "Identification and Control of Reliability Critical Items", Reliability Review ASQC, Vol. 5 & 6, 1985/1986.

X

Von Alven, W.H., "Reliability Engineering", Prentice Hall, Inc., Englewood Cliffs, NJ, 1964.

X

X

X

X

X

X

X

X