Table 42. References for Assessing Reliability Progress
References Blueprint Sections
3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 3.9 3.10 3.11 3.12 3.13 3.14 3.15 3.16 3.17 3.18 3.19
Arsenault, J.E. and Roberts, J.A., "Reliability of
Electronic Systems", Computer Science Press,
Inc., 1980.
X   X           X X       X X        
Barker, T.B., "Quality By Experimental
Design", Marcel Dekker, Inc., New York, NY,
1985.
        X                            
BENCH, "Benchmarking Commercial
Reliability Practices" by the Reliability
Analysis Center, Rome, NY, 1995.
X                                    
Blanton, P., Edwards, D., Schroen, W., "Finite
Element Analysis Application to
Semiconductor Devices", Ninth Annual
IEEE/AESS Avionics Integrity Program
Symposium, 1988.
                    X                
Box, G.E.P., Hunter, W.G., Hunter, J.S.,
"Statistical for Experiments", John Wiley &
Sons, NY, NY, 1978.
        X                            
CPE, "Reliability Toolkit: Commercial
Practices Edition", Rome Laboratory/
Reliability Analysis Center, Rome, NY, 1995.
      X X X X   X       X X   X X X X
Davis, O.L., "The Design and Analysis of
Industrial Experiments", Hafner Publishing Co.
        X                            
Design Reliability Training Course Manual,
Reliability Analysis Center, Rome, NY, 1995.
    X X         X X     X         X  
Dick, P., "System Effectiveness ... A Key to
Assurance", Proceedings Reliability and
Maintainability Symposium, 1988.
  X                                  
Fisher, R.A., Yates, F., "Statistical Tables for
Biological, Agricultural and Medical
Research", (4th edition), Edinburgh and
London: Oliver & Bayd Ltd., 1953.
        X                            
FMD-91, "Failure Mode/Mechanism
Distribution", Reliability Analysis Center,
Rome, NY, 1991.
          X   X                      
FMEA, "Failure Mode, Effects and Criticality
Analysis", Reliability Analysis Center, Rome,
NY, 1993.
              X                      
Followell, D., Fields, S., Liguore, S.,
"Improvements in Avionic - Durability
Analysis", Reliability and Maintainability
Symposium, 1993.
            X       X                
FTA, "Fault Tree Analysis Application Guide",
Reliability Analysis Center, Rome, NY, 1990.
                  X                  
Fuqua, N.B., "Reliability Engineering for
Electronic Design", Marcel Dekker, Inc., New
York, NY, 1987.
    X X           X                  
Hicks, C.R., "Fundamental Concepts in the
Design of Experiments", Holt, Rinehart and
Winston, Inc., New York, NY, 1982.
        X                            
Ireson, W.G., Coombs, C.F., "Handbook of
Reliability Engineering and Management",
McGraw-Hill, New York, NY 1988.
X   X                                
Kececioglu, D., "Reliability & Life Testing
Handbook," PTR Prentice Hall, Englewood
Cliffs, NJ, 1994.
                                  X  
Klinger, D.J., Nakada, Y., Menendz, M.A.,
"AT&T Reliability Manual" Van Nostrand
Reinhold, 1990.
                        X         X  
Klion, J., "Practical Electronic Reliability
Engineering", Van Norstrand Reinhold, 1992.
              X X       X X X        
Kolarik, W., Rasty, J., Chen, M., Km, Y.,
"Electronics/Avionics Integrity: Definition,
Measurement and Improvement", Reliability
and Maintainability Symposium, 1992.
            X       X   X            
Kreith, F., "Principles of Heat Transfer", 3rd
Edition, In Text Education Publishers, NY,
NY, 1973.
                            X        
Lambert, R., "Mechanical Durability Prediction
Methods", Reliability and Maintainability
Symposium, 1989.
            X                        
Mechanical Reliability Training Manual,
Reliability Analysis Center, Rome, NY, 1995.
              X   X     X            
MFAT-1, "Microelectronic Failure Analysis
Techniques: A Procedural Guide", Reliability
Analysis Center, Rome, NY, 1978.
                X                    
MIL-HDBK-217, "Reliability Prediction of
Electronic Equipment", 1995.
                        X            
MIL-HDBK-251, "Reliability/ Design Thermal
Applications", 1978.
                            X        
MIL-HDBK-338B, "Electronic Reliability
Design Handbook", Rome Laboratory, Rome,
NY, 1988 (draft).
  X X X       X X X       X X X X    
Neufelder, A.M., "Ensuring Software
Reliability", Marcel Dekker Inc., New York,
NY, 1993.
                        X            
NONOP-1, "Nonoperating Reliability
Databook", Reliability Analysis Center, Rome,
NY, 1987.
          X             X            
NPRD-95, "Nonelectronic Part Reliability
Data", Reliability Analysis Center, Rome, NY,
1995.
          X             X            
Pecht, M., "Integrated Circuit, Hybrid and
Multichip Module Package Design Guideline",
John Wiley and Sons, New York, NY, 1994.
            X       X       X        
PSAC, "Parts Selection Application and
Control", Reliability Analysis Center, Rome,
NY, 1993.
      X               X              
RADC-TR-82-179, "Sneak Analysis
Application Guidelines", Rome Laboratory,
Rome, NY, 1982.
                          X          
RADC-TR-85-91, "Impact on Nonoperating
Periods on Equipment Reliability", Rome
Laboratory, Rome, NY, 1985.
          X X           X            
RADC-TR-88-11D, "Reliability/
Maintainability/Testability Design for
Dormancy", Rome Laboratory, Rome, NY,
1988.
          X                          
RADC-TR-89-276, "Dormant Missile Test
Effectiveness", Rome Laboratory, Rome, NY,
1989.
          X                          
RADC-TR-89-281 "Reliability Assessment
Using Finite Element Techniques", Rome
Laboratory, Rome, NY, 1989.
                    X                
RADC-TR-90-109, "Integration of Sneak
Circuit With Design", Rome Laboratory,
Rome, NY, 1990.
                          X          
Raheja, D.G., "Assurance Technologies
Principles and Practices", McGraw-Hill Inc.,
New York, NY, 1991.
X   X   X     X   X     X X   X      
RL-TR-90-72, "Reliability Analysis Assessment
of Advanced Technologies", Rome Laboratory,
Rome, NY, 1990.
            X           X            
RL-TR-91-155, "Computer Aided Assessment
of Reliability Using Finite Element Methods",
Rome Laboratory, Rome, NY, 1991.
                    X                
RL-TR-91-251, "Reliability Assessment of
Wafer Scale Integration Using Finite Element
Analysis", Rome Laboratory, Rome, NY, 1991.
            X       X                
RL-TR-93-209, "A Quality Process Approach to
Electronic System Reliability", 1993.
X   X                                
RL-TR-93-249, "Accelerated Reliability Testing
Utilizing Design of Experiments," Rome
Laboratory, 1993.
                                  X  
RTMG, "RAC Thermal Management
Guidebook", Reliability Analysis Center,
Rome, NY, 1995.
                            X        
SCAT, "Automated Circuit Analysis
Technique", Rome Laboratory, Rome, NY,
1990.
                          X          
Schmidt, S.R., Launsby, R.G., "Understanding
Industrial Designed Experiments", Air Force
Academy Press Colorado Springs Co., 1989.
        X                            
Shooman, M.L., "Probabilistic Reliability
Engineering Approach", McGraw-Hill, 1968.
                        X            
Stasa, F.L. "Applied Finite Element Analysis for
Engineers, Holt Rinehart and Winston, New
York, NY, 1985.
            X       X                
Steinberg, D.S., "Cooling Techniques for
Electronic Equipment", John Wiley and Sons,
New York, NY, 1980.
                            X        
Taguchi, G., "Introduction to Quality
Engineering", American Supplier Institute, Inc.,
Dearborn, MI, 1986.
        X                            
"Thermal, Mechanical, Electrical and Physical
Properties of Selected Packaging Material,
Center for Information and Numerical Data
Analysis and Synthesis", Report 101, July 91.
          X                          
Tyler, D., "Reliability-Critical Items", NAC
R&M-STD-R00208, Indianapolis, IN, 1986.
  X                                  
Tyler, D., Gendron R., "Identification and
Control of Reliability Critical Items",
Reliability Review ASQC, Vol. 5 & 6,
1985/1986.
  X                                  
Von Alven, W.H., "Reliability Engineering",
Prentice Hall, Inc., Englewood Cliffs, NJ, 1964.
    X X         X                    
WCCA, "Worst Case Circuit Analysis
Application Guidelines", Reliability Analysis
Center, Rome, NY, 1993.
                              X